Show simple item record
dc.contributor.author |
Rodriguez Pereira, Jhonatan
|
cze |
dc.contributor.author |
Zazpe, Raul
|
cze |
dc.contributor.author |
Charvot, Jaroslav
|
cze |
dc.contributor.author |
Bureš, Filip
|
cze |
dc.contributor.author |
Macák, Jan
|
cze |
dc.date.accessioned |
2021-05-15T18:18:22Z |
|
dc.date.available |
2021-05-15T18:18:22Z |
|
dc.date.issued |
2020 |
eng |
dc.identifier.issn |
1055-5269 |
eng |
dc.identifier.uri |
https://hdl.handle.net/10195/77052 |
|
dc.description.abstract |
Molybdenum diselenide (MoSe2) thin films were deposited on annealed titanium foils by atomic layer deposition using suitable precursors. In this paper, a detailed x-ray photoelectron spectroscopy analysis of the MoSe2 film is presented. Survey spectra, Mo 3d, Se 3d, Mo 3p, Se LMM, Se 3p, C 1s, and Se 4s core level along with the valence band spectra were measured. Quantitative analysis indicates a surface composition of MoSe1.8, suggesting a deficiency of selenium on the surface. |
eng |
dc.format |
"024006-1"-"024006-8" |
eng |
dc.language.iso |
eng |
eng |
dc.publisher |
American Institute of Physics |
eng |
dc.relation.ispartof |
Surface Science Spectra, volume 27, issue: 2 |
eng |
dc.rights |
bez omezení |
cze |
dc.subject |
MoSe2 |
eng |
dc.subject |
transition metal dichalcogenides |
eng |
dc.subject |
thin films |
eng |
dc.subject |
2D material |
eng |
dc.subject |
XPS |
eng |
dc.subject |
MoSe2 |
cze |
dc.subject |
dichalkogenidy přechodných prvků |
cze |
dc.subject |
tenké vrstvy |
cze |
dc.subject |
2D materiály |
cze |
dc.subject |
XPS |
cze |
dc.title |
Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysis |
eng |
dc.title.alternative |
Tenké vrstvy MoSe2 připravené depozicí atomárních vrstev: XPS analýzy |
cze |
dc.type |
article |
eng |
dc.description.abstract-translated |
Tenké vrstvy selenidu molybdenatého (MoSe2) byly deponovány na vyžíhané titanové fólie pomocí depozice atomárních vrstev s využitím vhodných prekursorů. V článku popisujeme detailní analýzu těchto vrstev pomocí rentgenové fotoelektronové spektroskopie (XPS). V přehledovém spektru byly měřeny struktury jader Mo 3d, Se 3d, Mo 3p, Se LMM, Se 3p, C 1s, and Se 4s a také spektra valenčních pásů. Kvantitativní analýza indikovala povrochové složení MoSe1.8, které poukazuje na nedostatečné množství Se v povrchové vrstvě. |
cze |
dc.peerreviewed |
yes |
eng |
dc.publicationstatus |
preprint |
eng |
dc.identifier.doi |
10.1116/6.0000354 |
eng |
dc.relation.publisherversion |
https://avs.scitation.org/doi/full/10.1116/6.0000354 |
eng |
dc.identifier.wos |
000564178000001 |
eng |
dc.identifier.scopus |
2-s2.0-85090291834 |
|
dc.identifier.obd |
39884895 |
eng |
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