Study on refractive index dispersion dependences of inhomogeneous thin film layers prepared by material printing

Abstract

The contribution deals with a study of thin film layer properties prepared by material printing. The main attention is directed to the determination of geometrical and optical in-homogeneities of their properties. An interference microscope EPIVAL INTERPHACO was used for sample measurement, a defined source of white light was used for sample illumination. The recorded digital images were transformed from RGB to HSB colour space for calculation of optical parameters spectral dependences. The paper gives results of refractive index dispersion dependences obtained from the interference images of thickness and optical in-homogeneities.