Niobium ethoxide analyzed by XPS

Abstract

Niobium (V) ethoxide was characterized by x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. Survey spectra, Nb 3d, O 1s, C 1s, Nb 3p, Nb 4p, O 2s core levels, and valence band spectra were acquired. Results showed how the elements in the niobium ethoxide structure are bonded.