Microscopic and voltammetric properties of lustrous bismuth deposits

dc.contributor.author	Krolicka, Agnieszka
dc.contributor.author	Bobrowski, Andrzej
dc.contributor.author	Pamuła, Elżbieta
dc.date.accessioned	2011-02-10T11:29:22Z
dc.date.available	2011-02-10T11:29:22Z
dc.date.issued	2010
dc.identifier.isbn	978-80-7395-348-5 (printed)
dc.identifier.isbn	978-80-7395-349-2 (on-line)
dc.identifier.uri	http://hdl.handle.net/10195/38241
dc.description.abstract	A comparison of lustrous bismuth films, plated at glassy carbon, platinum and gold supports, is presented. The voltammetric performance of preplated bismuth film electrodes was tested using 50 μg/L In(III) and 50 μg/L Pb(II) solutions in 0.1 M acetic buffer in square wave and differential pulse modes. The influence of support material, plating solution concentration and storing conditions on the voltammetric response of BiFEs is discussed. The results of microscopic examinations revealing the deposits’ morphology are also included.	eng
dc.format	p. 85-96	eng
dc.language.iso	eng
dc.publisher	Univerzita Pardubice	cze
dc.relation.ispartof	Sensing in electroanalysis. K. Vytřas, K. Kalcher, I. Švancara (Eds.). 2010, Volume 5.	eng
dc.rights	open access	eng
dc.subject	bismuth film electrode	eng
dc.subject	lead	eng
dc.subject	indium	eng
dc.subject	stripping voltammetry	eng
dc.subject	scanning microscopy	eng
dc.subject	atomic force microscopy	eng
dc.title	Microscopic and voltammetric properties of lustrous bismuth deposits	eng
dc.type	Article	eng
dc.peerreviewed	yes	eng
dc.publicationstatus	published	eng