Microscopic and voltammetric properties of lustrous bismuth deposits

Show simple item record

dc.contributor.author Krolicka, Agnieszka
dc.contributor.author Bobrowski, Andrzej
dc.contributor.author Pamuła, Elżbieta
dc.date.accessioned 2011-02-10T11:29:22Z
dc.date.available 2011-02-10T11:29:22Z
dc.date.issued 2010
dc.identifier.isbn 978-80-7395-348-5 (printed)
dc.identifier.isbn 978-80-7395-349-2 (on-line)
dc.identifier.uri http://hdl.handle.net/10195/38241
dc.description.abstract A comparison of lustrous bismuth films, plated at glassy carbon, platinum and gold supports, is presented. The voltammetric performance of preplated bismuth film electrodes was tested using 50 μg/L In(III) and 50 μg/L Pb(II) solutions in 0.1 M acetic buffer in square wave and differential pulse modes. The influence of support material, plating solution concentration and storing conditions on the voltammetric response of BiFEs is discussed. The results of microscopic examinations revealing the deposits’ morphology are also included. eng
dc.format p. 85-96 eng
dc.language.iso eng
dc.publisher Univerzita Pardubice cze
dc.relation.ispartof Sensing in electroanalysis. K. Vytřas, K. Kalcher, I. Švancara (Eds.). 2010, Volume 5. eng
dc.rights open access eng
dc.subject bismuth film electrode eng
dc.subject lead eng
dc.subject indium eng
dc.subject stripping voltammetry eng
dc.subject scanning microscopy eng
dc.subject atomic force microscopy eng
dc.title Microscopic and voltammetric properties of lustrous bismuth deposits eng
dc.type Article eng
dc.peerreviewed yes eng
dc.publicationstatus published eng

This item appears in the following Collection(s)

Show simple item record

Search DSpace

Advanced Search


My Account